An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)

The selection of a reference diffraction pattern for high (angular) resolution electron backscatter diffraction (HR-EBSD) significantly affects the precision of the calculated strain and rotation maps.  

This effect has been demonstrated in a paper* in Ultramicroscopy by Abdo Koko and Vivian Tong (NPL), Angus Wilkinson  and James Marrow in plastically deformed body-centred cubic and face-centred cubic ductile metals and elastically deformed single-crystal silicon.

An empirical relationship is identified between the cross-correlation parameter and angular error, which is used in an iterative algorithm to identify the optimal reference pattern to maximise the precision of HR-EBSD measurements.

'An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)'.