Characterisation
A wide range of characterisation techniques including SEM/TEM/STEM, FIB, FIM/3DAP, NanoSIMS, STM etc.
Lead Academic Staff: Paul Bagot, Harish Bhaskaran, Peter Bruce, Martin Castell, Nicole Grobert, Chris Grovenor, Judy Kim, Angus Kirkland, Sergio Lozano-Perez, Katarina (Tinka) Marquardt, Pete Nellist, Mauro Pasta, Susie Speller, Rob Weatherup, Angus J Wilkinson
Related Websites:
- David Cockayne Centre for Electron Microscopy
- Oxford NanoAnalysis
- Scanning Transmission Electron Microscopy Group
- Electron Image Analysis Group
- electron Physical Science Imaging Centre
- Surface Nanoscience Group
- Atom Probe Group
- NanoSIMS Group
- Nanomaterials by Design Group
- Advanced Nanoscale Engineering Group
- Center for Applied Superconductivity
- Peter Bruce Group
- The Pasta Group
- Energy Materials Interfaces Group
- Oxford Micromechanics Group
Researchers
Harish Bhaskaran, FREng
Harish Bhaskaran, FREng
Professor of Applied Nanomaterials, Associate Head of Division for Research - (On Leave HT 2025)
Katharina (Tinka) Marquardt
Katharina (Tinka) Marquardt
Associate Professor of Materials Microscopy and Microstructure Evolution