Characterisation
A wide range of characterisation techniques including SEM/TEM/STEM, FIB, FIM/3DAP, NanoSIMS, STM etc.
Lead Academic Staff: Paul Bagot, Harish Bhaskaran, Peter Bruce, Martin Castell, Nicole Grobert, Chris Grovenor, Judy Kim, Angus Kirkland, Sergio Lozano-Perez, Katarina (Tinka) Marquardt, Pete Nellist, Mauro Pasta, Susie Speller, Rob Weatherup, Angus J Wilkinson
Related Websites:
- David Cockayne Centre for Electron Microscopy
- Oxford NanoAnalysis
- Scanning Transmission Electron Microscopy Group
- Electron Image Analysis Group
- electron Physical Science Imaging Centre
- Surface Nanoscience Group
- Atom Probe Group
- NanoSIMS Group
- Nanomaterials by Design Group
- Advanced Nanoscale Engineering Group
- Center for Applied Superconductivity
- Peter Bruce Group
- The Pasta Group
- Energy Materials Interfaces Group
- Oxford Micromechanics Group
Researchers
Harish Bhaskaran, FREng
Harish Bhaskaran, FREng
Professor of Applied Nanomaterials, Associate Head of Division (SP) - (On Leave from Jan 2025)
Sir Peter Bruce FRS
Sir Peter Bruce FRS
Head of Department, Wolfson Chair, and Professor of Materials
Katharina (Tinka) Marquardt
Katharina (Tinka) Marquardt
Associate Professor of Materials Microscopy and Microstructure Evolution