Characterisation

A wide range of characterisation techniques including SEM/TEM/STEM, FIB, FIM/3DAP, NanoSIMS, STM etc.

Related Websites:

Senior Research Staff, ePSIC Principal Scientist

Atom Probe Group Leader/Senior Atom Probe Scientist

Professor of Applied Nanomaterials, Associate Head of Division (Research)

Wolfson Chair, Professor of Materials

Professor of Materials, Associate Head of Division (Taught Degrees)

Professor of Nanomaterials

Departmental Lecturer in Aberration Corrected Transmission Electron Microscopy

Professor of Materials

George Kelley Professor of Materials

Associate Professor of Materials Microscopy and Microstructure Evolution

Professor of Materials

Professor of Materials Science

Professor of Energy Materials

Professor of Materials (he/him*)

Researchers