In-Situ Monitoring of In0.53Al0.13Ga0.34As/In0.52Al0.48As 1.55 µm Vertical Cavity Surface Emitting Laser Structure Grown by Metal Organic Chemical Vapor Deposition

Baek J-H, Lee B, Han WS, Cho HK, Smith JM, Choi IH
1 May 1999
Journal article
Journal:
Japanese Journal of Applied Physics
Volume:
38
Issue:
5R
,
IOP Publishing
,
p.
2707
No abstract available
Keywords:
40 Engineering
DOI
10.1143/jjap.38.2707