My interests are focused upon enabling materials research at the nanoscale via the microscopy techniques of atom probe tomography (APT) and field ion microscopy (FIM). APT is a technique capable of material characterisations at the atomic-scale, in which each atom is identified chemically and located in three-dimensions with very high accuracy. Hence, it is a technique rapidly rising in prominence. I was formerly the Head of the Atom Probe Group in the Department of Materials at the University of Oxfordm which is interested and active in all areas of this research across a broad range of material systems.
In particular, I am developing a variety of new analytical techniques to improve the three dimensional reconstructions generated by APT and the subsequent atom-by-atom analysis of the resulting data. I am interested in applying these techniques to the characterisation of a wide variety of systems to inform materials research projects.